Location History:
- Osaka, JP (2019 - 2022)
- Hirakata, JP (2020 - 2024)
Company Filing History:
Years Active: 2019-2024
Title: Ikuo Wakayama: Innovator in Light Scattering Measurement Technology
Introduction
Ikuo Wakayama is a notable inventor based in Hirakata, Japan. He has made significant contributions to the field of measurement technology, particularly in light scattering and zeta-potential measurement. With a total of six patents to his name, Wakayama continues to push the boundaries of innovation in his field.
Latest Patents
Wakayama's latest patents include a light scattering measuring apparatus and a zeta-potential measurement jig. The light scattering measuring apparatus features multiple light sources, a single light receiver, and a sample holder designed for both forward and back measurements. This innovative design allows for precise measurements by utilizing a moving mechanism that adjusts the position of the optical paths. The zeta-potential measurement jig simplifies the process of placing samples in a cell without the need for dedicated tools. This jig is designed for use with electrophoretic mobility measuring devices and includes a frame body with holding walls and an intermediate block for enhanced functionality.
Career Highlights
Wakayama is currently employed at Otsuka Electronics Co., Ltd., where he applies his expertise in measurement technology. His work has led to advancements that benefit various applications in scientific research and industry. His dedication to innovation is evident in the practical solutions he develops.
Collaborations
Wakayama collaborates with talented coworkers, including Hiroya Nagasawa and Yusuke Izutani. Together, they contribute to the innovative environment at Otsuka Electronics Co., Ltd., fostering creativity and technological advancement.
Conclusion
Ikuo Wakayama is a distinguished inventor whose work in light scattering measurement technology and zeta-potential measurement has made a significant impact. His contributions continue to enhance the capabilities of measurement devices, showcasing his commitment to innovation and excellence in his field.