Otsuka Electronics Co., Ltd.

Ikuo Wakayama

Hiroya Nagasawa

Yusuke Izutani

Yoshiyuki Kobayashi

Kazuyoshi Kamekawa

Toru Takegawa

Sayaka Obana

Provided are a light scattering measuring apparatus. The light scattering measuring apparatus includes: light sources; a single light receiver; a sample holder including a cell, a frame body, a first opening formed in an incident portion of a first optical path used for forward measurement or side measurement, and a second opening formed in an incident portion of a second optical path used for back measurement, and an optical element; and a moving mechanism. The first optical path and the second optical path are separated from each other in vertical direction. The moving mechanism moves the first opening to a position of the incident portion of the first optical path when the forward or side measurement is to be performed, and to move the second opening to a position of the incident portion of the second optical path when the back measurement is to be performed.

Light scattering measuring apparatus and measuring jig

To provide a zeta-potential measurement jig which does not require dedicated tools and enables placement of a sample in a cell with simple work. Provided is a zeta-potential measurement jig, to be used for an electrophoretic mobility measuring device, including: a frame body including: a first holding wall and a second holding wall; and a bottom wall; an intermediate block, and a cell retainer, wherein at least one of the first holding wall or the second holding wall has one of a first groove or a first protrusion to be elastically fitted into the first groove, which is configured to support the intermediate block on a lateral side, and wherein the intermediate block has another one of the first groove or the first protrusion.

Zeta-potential measurement jig

Provided are a particle size measurement method, a particle size measurement apparatus, and a particle size measurement program in which a needless measurement time period is omitted by setting an appropriate measurement time period in accordance with a particle size to be measured. The particle size measurement method includes: a test measurement step; an autocorrelation function calculation step; a setting step of setting a part of a plurality of measurement timings set in advance as measurement timings to be used for main measurement, based on a time period required until an autocorrelation function falls below a predetermined threshold value and a preliminary time period set and added to the time period; a main measurement step of measuring a main measurement intensity of scattered light during a main measurement time period; and a particle size calculation step of calculating a particle size of a sample.

Particle size measurement method, particle size measurement apparatus, and particle size measurement program

Sample analyzer

An optical measurement apparatus includes a main body base, an optical base movably combined with the main body base, a measurement optical system fixed to the optical base, and an optical base moving mechanism which moves the optical base relative to the main body base. The optical base moving mechanism moves the optical base relative to the main body base between an internal measurement position and an external measurement position. A measurement object position of the measurement optical system coincides with an internal measurement object position within the main body base. The measurement object position of the measurement optical system coincides with an external measurement object position outside the main body base.

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Hirakata, Japan

Ikuo Wakayama