This inventor holds 5 USPTO granted patents. Top assignee: Otsuka Electronics Co., Ltd.. Active years: 1993-2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Shiga, JP (1993 - 2005)
- Ritto, JP (2009 - 2012)
Company Filing History:
Years Active: 1993-2012
Title: The Innovations of Makoto Okawauchi
Introduction
Makoto Okawauchi is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of optical measurement technology, holding a total of five patents. His work focuses on developing advanced devices and methods for measuring optical characteristics, which are essential in various scientific and industrial applications.
Latest Patents
One of Okawauchi's latest patents is an optical characteristic measurement device and method suitable for spectrum measurement. This innovative device includes a photodetector and a processor. The photodetector features a detection surface larger than the light incident surface that receives light from a spectrometer. The processor is designed to obtain a measurement spectrum detected in a first detection area and a signal intensity detected in a second detection area. It corrects a pre-prepared pattern that exhibits the noise characteristics of the photodetector based on the signal intensity to calculate a first correction spectrum. Furthermore, it subtracts a correction value from each component value of the measurement spectrum to derive a second correction spectrum, ultimately calculating an output spectrum.
Another aspect of his patent involves a processing unit that obtains a first spectrum and a first signal intensity after the light entering the housing is cut off. It calculates a first correction spectrum by subtracting a first correction value from each component value of the first spectrum. The processing unit also obtains a second spectrum and a second signal intensity while a cut-off portion is opened, calculating a second correction spectrum by subtracting a second correction value. The output spectrum representing the measurement result is derived by subtracting the first correction spectrum from the second correction spectrum.
Career Highlights
Throughout his career, Okawauchi has worked with prominent companies, including Otsuka Electronics Co., Ltd. and Otsuka Electronic Co., Ltd. His experience in these organizations has contributed to his expertise in optical measurement technologies.
Collaborations
Okawauchi has collaborated with notable colleagues such as Tsutomu Mizuguchi and Hiroyuki Sano. Their combined efforts have further advanced the field of optical measurement.
Conclusion
Makoto Okawauchi's contributions to optical measurement technology through his innovative patents and collaborations highlight his significant role in the field. His work continues to influence advancements in optical characteristic measurement devices and methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
