The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Jun. 19, 2001
Kouichi Oka, Otsu, JP;
Makoto Okawauchi, Shiga, JP;
Kouichi Oka, Otsu, JP;
Makoto Okawauchi, Shiga, JP;
Otsuka Electronics Co., Ltd., Hirakata, JP;
Abstract
In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile