The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Nov. 29, 2011
Hiroyuki Sano, Konan, JP;
Makoto Okawauchi, Ritto, JP;
Kosei Oshima, Kyotanabe, JP;
Kazuaki Ohkubo, Kusatsu, JP;
Tsutomu Mizuguchi, Ritto, JP;
Shiro Shima, Takatsuki, JP;
Hiroyuki Sano, Konan, JP;
Makoto Okawauchi, Ritto, JP;
Kosei Oshima, Kyotanabe, JP;
Kazuaki Ohkubo, Kusatsu, JP;
Tsutomu Mizuguchi, Ritto, JP;
Shiro Shima, Takatsuki, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.