Company Filing History:
Years Active: 2012
Title: Shiro Shima: Innovator in Optical Measurement Technology
Introduction
Shiro Shima is a prominent inventor based in Takatsuki, Japan. He has made significant contributions to the field of optical measurement technology, holding 2 patents that showcase his innovative approach to spectrum measurement.
Latest Patents
Shima's latest patents include an optical characteristic measurement device and an optical characteristic measurement method suitable for spectrum measurement. The processing unit in his invention obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off. It then calculates a first correction spectrum by subtracting a first correction value, based on the first signal intensity, from each component value of the first spectrum. Furthermore, the processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened. It calculates a second correction spectrum by subtracting a second correction value from each component value of the second spectrum. Ultimately, the processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
Career Highlights
Shiro Shima is currently employed at Otsuka Electronics Co., Ltd., where he continues to develop cutting-edge technologies in optical measurement. His work has significantly advanced the capabilities of optical characteristic measurement devices, making them more efficient and accurate.
Collaborations
Shima collaborates with notable colleagues such as Hiroyuki Sano and Makoto Okawauchi, contributing to a dynamic and innovative work environment.
Conclusion
Shiro Shima's contributions to optical measurement technology reflect his dedication to innovation and excellence in his field. His patents not only enhance measurement accuracy but also pave the way for future advancements in optical technologies.
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