Company Filing History:
Years Active: 2012
Title: Kosei Oshima: Innovator in Optical Measurement Technologies
Introduction
Kosei Oshima is a notable inventor based in Kyotanabe, Japan. He has made significant contributions to the field of optical measurement technologies, holding a total of 2 patents. His work focuses on developing devices and methods that enhance the accuracy and efficiency of spectrum measurement.
Latest Patents
Oshima's latest patents include an optical characteristic measurement device and an optical characteristic measurement method suitable for spectrum measurement. The processing unit in his device obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off. It then calculates a first correction spectrum by subtracting a first correction value, based on the first signal intensity, from each component value of the first spectrum. Furthermore, the processing unit obtains a second spectrum detected in the first detection area while a cut-off portion is opened and calculates a second correction spectrum by subtracting a second correction value from each component value of the second spectrum. Ultimately, the processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
Career Highlights
Kosei Oshima is currently employed at Otsuka Electronics Co., Ltd., where he continues to innovate in the field of optical measurement. His work has been instrumental in advancing the capabilities of photodetectors and processors used in spectrum measurement.
Collaborations
Oshima collaborates with talented coworkers, including Hiroyuki Sano and Makoto Okawauchi. Their combined expertise contributes to the development of cutting-edge technologies in optical measurement.
Conclusion
Kosei Oshima's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in spectrum measurement, positioning him as a key figure in this field.
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