Balzers, Liechtenstein

Oerlikon Advanced Technologies Ag

Calculating rank
USPTO Granted Patents = 11

% Expired Patents = 45.5


Trademarks = 1

Forward Citations = 72

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20 inventors (with patents filed for the assignee):

goldMedal Glyn Jeremy Reynolds (4 out of 5 patents)

silverMedal Juergen Weichart (2 out of 14 patents)

bronzeMedal Stephan Voser (2 out of 7 patents)

4.  Gerhard Dovids (2 out of 2 patents)

5.  Werner Oskar Martienssen (2 out of 2 patents)

6.  Mohamed Elghazzali (1 out of 7 patents)

7.  Jurgen Weichart (1 out of 14 patents)

8.  Rolf Bazlen (1 out of 6 patents)

9.  Wolfgang Rietzler (1 out of 5 patents)

10.  Bart Scholte Von Mast (1 out of 6 patents)

11.  Rogier Lodder (1 out of 7 patents)

12.  Daniel Rohrer (1 out of 4 patents)

13.  Stefan Borja Bammesberger (1 out of 4 patents)

14.  Bernd Heinz (1 out of 5 patents)

15.  Dennis Minkoley (1 out of 2 patents)


11 patents:

Company Overview
Oerlikon Advanced Technologies AG, based in Balzers, Liechtenstein, specializes in advanced surface solutions and materials engineering. The company focuses on developing innovative technologies that enhance the performance and durability of components across various industries, including aerospace, automotive, and energy. With a commitment to sustainability, Oerlikon integrates cutting-edge research in coatings and additive manufacturing to address the evolving needs of its global clientele, ensuring high-quality and efficient solutions.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

11 Patents

#5 in Balzers

#25 in Liechtenstein

#51,831 in the World

Balzers, LI
Balzers, Liechtenstein
Forward Citations = 72

20 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Oerlikon Advanced Technologies Ag. Retrieved from https://idiyas.com/company/oerlikon-advanced-technologies-ag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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