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Daejeon, South Korea

Intekplus Co., Ltd.

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USPTO Granted Patents = 15

% Expired Patents = 6.7

EPO Patents = 6

Forward Citations = 24

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44 inventors (with patents filed for the assignee):

Ssang-Gun Lim (8 out of 8 patents)

Sang-Yoon Lee (5 out of 5 patents)

Min-Gu Kang (3 out of 4 patents)

4. Min Gu Kang (3 out of 50 patents)

5. Dug Young Kim (2 out of 2 patents)

6. Dong Eun Kim (2 out of 2 patents)

7. Sang-Yun Lee (2 out of 4 patents)

8. MinGu Kang (2 out of 2 patents)

9. Yi-Bae Choi (2 out of 2 patents)

10. Won Sang Hwang (2 out of 2 patents)

11. Byeong Gwon Joo (2 out of 2 patents)

12. Young Bo Kwak (2 out of 2 patents)

13. Hyun-Min Lee (1 out of 10 patents)

14. Seung Rag Lee (1 out of 3 patents)

15. Young Jae Won (1 out of 3 patents)

15 patents: Sort by Forward Citations

1. 12506017 - System and method for confirming mounted state of picker mounts (2025-12-23),

2. 12452544 - Inspection system for roll-to-roll equipment (2025-10-21),

3. 12085608 - Picker device (2024-09-10),

4. 11280736 - Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor (2022-03-22),

5. 10845311 - Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error through virtual fluorescence distribution model from signal collected in analog mean delay method (2020-11-24),

6. 10753872 - Apparatus and method for measuring fluorescence lifetime (2020-08-25),

7. 9412159 - Method for inspecting flat panel (2016-08-09),

8. 9218050 - Method and device for transmitting/receiving image data at high speed (2015-12-22),

9. 8493570 - Three-dimensional shape measuring apparatus (2013-07-23),

10. 8319961 - Apparatus to perform a non-contact test of a semiconductor package (2012-11-27),

11. 8259305 - Surface shape measuring system and surface shape measuring method using the same (2012-09-04),

12. 8155483 - Apparatus for and method of measuring image (2012-04-10),

13. 8056698 - Tray handling apparatus and semiconductor device inspecting method using the same (2011-11-15),

14. 7092105 - Method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object (2006-08-15),

15. 6873421 - Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment (2005-03-29),

Company Overview

Intekplus Co., Ltd. is a South Korean company based in Daejeon, specializing in advanced materials and technologies for various applications. The organization focuses on the development and manufacturing of innovative solutions in the fields of electronics, energy, and environmental technologies. With a commitment to research and development, Intekplus aims to enhance performance and sustainability across its product offerings, contributing to advancements in multiple industries while addressing contemporary challenges in technology and environmental impact.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

15 Patents

#46 in Daejeon

#782 in South Korea

#39,991 in the World

Daejeon, South Korea

Intekplus Co., Ltd.

Forward Citations = 24

44 inventors:

Ssang-Gun Lim (8 out of 8 patents)

Sang-Yoon Lee (5 out of 5 patents)

Min-Gu Kang (3 out of 4 patents)

4. Min Gu Kang (3 out of 50 patents)

5. Dug Young Kim (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Intekplus Co., Ltd.. Retrieved from https://idiyas.com/company/intekplus-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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