The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Oct. 31, 2001
Ssang-gun Lim, Taejeon, KR;
Gee-hong Kim, Taejeon, KR;
Yi-bae Choi, Taejeon, KR;
Sang-yoon Lee, Taejeon, KR;
Ssang-Gun Lim, Taejeon, KR;
Gee-Hong Kim, Taejeon, KR;
Yi-Bae Choi, Taejeon, KR;
Sang-Yoon Lee, Taejeon, KR;
Intek Plus Co., Ltd., , KR;
Abstract
A method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object. The method and apparatus for measuring the three-dimensional surface shape of the object, in which a real-time measurement of the three-dimensional surface is performed by projecting a beam of light having color information onto the object and detecting color distribution information according to levels of the object, thereby obtaining level information of the object.