Taejon, South Korea

Gee-Hong Kim

This inventor holds 1 USPTO granted patent. Top assignee: Intekplus Co., Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gee-Hong Kim. Retrieved from https://idiyas.com/inventor/gee-hong-kim-8bu71ntg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Gee-Hong Kim

Introduction

Gee-Hong Kim is a notable inventor based in Taejeon, South Korea. He has made significant contributions to the field of measurement technology, particularly in the area of three-dimensional surface shape measurement. His innovative approach utilizes color information from light reflected by objects, showcasing his expertise and creativity in the field.

Latest Patents

Gee-Hong Kim holds a patent for a "Method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object." This invention allows for real-time measurement of an object's three-dimensional surface by projecting a beam of light with color information onto the object. The method detects color distribution information according to the object's levels, thereby obtaining detailed level information.

Career Highlights

Gee-Hong Kim is associated with Intekplus Co., Ltd., where he continues to develop and refine his innovative technologies. His work has garnered attention for its practical applications in various industries, enhancing the accuracy and efficiency of surface measurements.

Collaborations

Some of his notable coworkers include Ssang-Gun Lim and Yi-Bae Choi, who have collaborated with him on various projects, contributing to the advancement of measurement technologies.

Conclusion

Gee-Hong Kim's contributions to the field of measurement technology exemplify the impact of innovative thinking in solving complex problems. His patented methods and ongoing work at Intekplus Co., Ltd. continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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