The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2016
Filed:
Sep. 13, 2012
Jai-ho Son, Gwangju, KR;
Hyun-min Lee, Daejeon, KR;
Min-gu Kang, Daejeon, KR;
Sang-yoon Lee, Daejeon, KR;
Ssang-gun Lim, Daejeon, KR;
Jai-Ho Son, Gwangju, KR;
Hyun-Min Lee, Daejeon, KR;
Min-Gu Kang, Daejeon, KR;
Sang-Yoon Lee, Daejeon, KR;
Ssang-Gun Lim, Daejeon, KR;
INTEKPLUS CO., LTD., Daejeon, KR;
Abstract
Disclosed is a method for inspecting a flat panel. The method for inspecting the flat panel includes the steps of: arranging a camera at a measurement location of the flat panel by horizontally moving at least one of the flat panel and the camera; automatically focusing the camera with respect to a measuring target of the flat panel at the measurement location; acquiring a plurality of images for the measuring target by vertically moving the focused camera within a set region on the basis of the present location of the camera when focusing the camera; selecting the image having the most definition for the measuring target among the acquired images; processing the selected image; and determining whether the measuring target is defective or not.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile