The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Oct. 31, 2001
Ssang-gun Lim, Taejeon, KR;
Seung-woo Kim, Taejeon, KR;
Sang-yoon Lee, Taejeon, KR;
Chang-jin Chung, Seoul, KR;
Yi-bae Choi, Taejeon, KR;
Young-sik Cho, Taejeon, KR;
Kyung-keun Park, Taejeon, KR;
Ssang-Gun Lim, Taejeon, KR;
Seung-Woo Kim, Taejeon, KR;
Sang-Yoon Lee, Taejeon, KR;
Chang-Jin Chung, Seoul, KR;
Yi-Bae Choi, Taejeon, KR;
Young-Sik Cho, Taejeon, KR;
Kyung-Keun Park, Taejeon, KR;
Intek Plus Co., Ltd., , KR;
Abstract
An apparatus and method for measuring a three-dimensional shape of an object using a projection moiré device. The method comprises the steps of obtaining a grid pattern image projected on a reference plane of a moving table and applying a buckets algorithm thereto, thereby achieving a reference phase, obtaining a grid pattern image projected on the object set on the moving table and applying a buckets algorithm thereto, thereby achieving an object phase, calculating a difference phase between the object phase and the reference phase, thereby achieving a moiré phase, and unwrapping the moiré phase, thereby achieving a level information of the object. The apparatus and method measure the three-dimensional shape using a projection grid without a reference grid, thereby achieving compactness of equipment, simplicity in usage and manufacturing cost reduction.