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Los Angeles, CA, United States of America

Hi LLC

USPTO Granted Patents = 145

% Expired Patents = 2.8

EPO Patents = 1

Trademarks = 9

Forward Citations = 976

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80 inventors (with patents filed for the assignee):

Ryan Field (58 out of 58 patents)

Jamu Alford (44 out of 55 patents)

Bruno Do Valle (32 out of 32 patents)

4. Husam Katnani (31 out of 31 patents)

5. Jacob Dahle (29 out of 29 patents)

6. Rong Jin (24 out of 25 patents)

7. Hooman Mohseni (24 out of 43 patents)

8. Ethan Pratt (23 out of 24 patents)

9. Sebastian Sorgenfrei (22 out of 22 patents)

10. Micah Ledbetter (21 out of 29 patents)

11. Isai Olvera (18 out of 18 patents)

12. Scott Jeremy Seidman (17 out of 17 patents)

13. Ricardo Jiménez-Martínez (16 out of 16 patents)

14. Michael Henninger (15 out of 15 patents)

15. Daniel Sobek (14 out of 53 patents)

Core Competencies:

Optical Measurement

Calibration Techniques

Photodetector Sensitivity

Noise Reduction

Multimodal Systems

Biopotential Recordings

Magnetic Field Measurement

Neural Detection

Wearable Devices

Non-Invasive Detection

Time-of-Flight

Magnetoencephalography

145 patents: Sort by Forward Citations

1. 12642487 - Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members (2026-06-02),

2. 12629062 - Time domain-based optical measurement systems and methods configured to measure absolute properties of tissue (2026-05-19),

3. 12502079 - Instrument response function monitor on an optical measurement device (2025-12-23),

4. 12440135 - Systems and methods for calibration of an optical measurement system (2025-10-14),

5. 12436280 - Maintaining consistent photodetector sensitivity in an optical measurement system (2025-10-07),

6. 12433543 - Techniques for determining a timing uncertainty of a component of an optical measurement system (2025-10-07),

7. 12433517 - Devices, systems, and methods for calibrating an optical measurement device (2025-10-07),

8. 12251233 - Multimodal wearable measurement systems and methods (2025-03-18),

9. 12235154 - Maintaining consistent photodetector sensitivity in an optical measurement system (2025-02-25),

10. 12226187 - Estimation of source-detector separation in an optical measurement system (2025-02-18),

11. 12213765 - Photodetector calibration of an optical measurement system (2025-02-04),

12. 12147870 - Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system (2024-11-19),

13. 12144653 - Systems, circuits, and methods for reducing common-mode noise in biopotential recordings (2024-11-19),

14. 12138068 - Techniques for characterizing a nonlinearity of a time-to-digital converter in an optical measurement system (2024-11-12),

15. 12097010 - Maintaining consistent photodetector sensitivity in an optical measurement system (2024-09-24),

Company Overview

Hi LLC, based in Los Angeles, CA, specializes in the development of advanced optical measurement systems. The company focuses on enhancing calibration techniques and improving photodetector sensitivity, which are crucial for accurate data acquisition in various applications. Their expertise extends to noise reduction strategies and the integration of multimodal systems, facilitating precise biopotential recordings and magnetic field measurements. Hi LLC is dedicated to advancing neural detection technologies, contributing to innovations in both research and practical implementations.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

145 Patents

#12 in Los Angeles, CA

#596 in California

#2,703 in US

#5,622 in the World

Los Angeles, CA, United States of America

Hi LLC

Forward Citations = 976

80 inventors:

Ryan Field (58 out of 58 patents)

Jamu Alford (44 out of 55 patents)

Bruno Do Valle (32 out of 32 patents)

4. Husam Katnani (31 out of 31 patents)

5. Jacob Dahle (29 out of 29 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hi LLC. Retrieved from https://idiyas.com/company/hi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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