The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Mar. 16, 2021
Applicant:
HI Llc, Los Angeles, CA (US);
Inventors:
Sebastian Sorgenfrei, Playa Vista, CA (US);
Viswanath Ambalapuzha Gopalakrishnan, Culver City, CA (US);
Katherine Perdue, Los Angeles, CA (US);
Isai Olvera, San Jose, CA (US);
Ryan Field, Culver City, CA (US);
Assignee:
HI LLC, Culver City, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G04F 10/00 (2006.01); A61B 5/00 (2006.01); A61B 5/026 (2006.01); G01J 1/44 (2006.01); H03M 1/50 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4064 (2013.01); A61B 5/0261 (2013.01); A61B 5/7225 (2013.01); G04F 10/005 (2013.01); G01J 1/44 (2013.01); H03M 1/50 (2013.01);
Abstract
An illustrative optical measurement system includes a signal generator configured to generate a signal and a processing unit configured to direct the signal generator to apply the signal to a TDC included in the optical measurement system and generate, based on timestamp symbols recorded by the TDC in response to the signal, characterization data representative of a nonlinearity of the TDC.