The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Feb. 27, 2024
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Ryan Field, Culver City, CA (US);

Katherine Perdue, Los Angeles, CA (US);

Hamid Dehghani, Birmingham, GB;

Assignee:

HI LLC, Culver City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0082 (2013.01); A61B 5/4064 (2013.01); A61B 5/6803 (2013.01); G01B 11/14 (2013.01); A61B 2562/0238 (2013.01); A61B 2576/026 (2013.01);
Abstract

An optical measurement system includes a light source configured to emit a first light pulse and a second light pulse toward a target, a detector, and a processing unit. The first light pulse has a first wavelength and the second light pulse has a second wavelength different from the first wavelength. The processing unit is configured to determine a plurality of temporal distributions of photons included in the first light pulse and the second light pulse and detected by the detector after the photons are scattered by the target, and determine, based on the plurality of temporal distributions and a source-detector distance estimation model, a distance between the light source and the detector.


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