The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 22, 2024
Applicant:

HI Llc, Culver City, CA (US);

Inventors:

Husam Katnani, Braintree, MA (US);

Katherine Perdue, Los Angeles, CA (US);

Ryan Field, Culver City, CA (US);

Isai Olvera, South Portland, ME (US);

Assignee:

HI LLC, Culver City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/00 (2006.01); A61B 90/00 (2016.01); A61B 90/30 (2016.01);
U.S. Cl.
CPC ...
A61B 5/14553 (2013.01); A61B 5/6803 (2013.01); A61B 5/4088 (2013.01); A61B 2090/306 (2016.02); A61B 2090/3614 (2016.02); A61B 2562/0238 (2013.01);
Abstract

An optical measurement system includes a detector configured to detect signal photons included in a light pulse after the signal photons enter a body of a user and are scattered by a target within the body and reference photons included in the light pulse, the reference photons being diverted to the detector without entering the body. The optical measurement system further includes a processing unit configured to determine a temporal distribution of the signal photons detected by the detector, determine a temporal distribution of the reference photons detected by the detector, and generate measurement data based on the temporal distribution of the signal photons and the temporal distribution of the reference photons.


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