The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Nov. 16, 2023
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Isai Olvera, South Portland, ME (US);

Han Yong Ban, Los Angeles, CA (US);

Dakota Blue Decker, Los Angeles, CA (US);

Yaroslav Chekin, Venice, CA (US);

Joshua Schmidt, Los Angeles, CA (US);

Ryan Field, Culver City, CA (US);

Assignee:

HI LLC, Culver City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0075 (2013.01); A61B 5/0042 (2013.01); A61B 2562/0238 (2013.01); A61B 2562/046 (2013.01);
Abstract

An illustrative optical measurement system may include a module comprising a light source configured to emit light directed at a target, a plurality of detectors configured to detect target photon arrival times of target photons of the light after the light is scattered by the target, and a reference detector configured to detect reference photon arrival times of reference photons of the light after the light is reflected within the module. The system may further include a controller configured to determine, based on an output from the reference detector, an instrument response function (IRF) of the module.


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