Los Angeles, CA, United States of America

Joshua Schmidt

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hi LLC. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joshua Schmidt. Retrieved from https://idiyas.com/inventor/joshua-schmidt-d2nxodid

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Joshua Schmidt

Introduction

Joshua Schmidt is an accomplished inventor based in Los Angeles, CA. He has made significant contributions to the field of optical measurement devices. His innovative work has led to the development of a unique patent that enhances the functionality of optical systems.

Latest Patents

Joshua Schmidt holds a patent for an "Instrument response function monitor on an optical measurement device." This patent describes an illustrative optical measurement system that includes a module with a light source, multiple detectors, and a reference detector. The system is designed to determine the instrument response function (IRF) based on outputs from the reference detector, thereby improving the accuracy of optical measurements.

Career Highlights

Joshua is currently employed at Hi LLC, where he continues to push the boundaries of optical technology. His work has been instrumental in advancing the capabilities of measurement devices used in various applications.

Collaborations

Joshua collaborates with Han Yong Ban, a fellow innovator in the field. Together, they work on projects that aim to enhance the performance and reliability of optical measurement systems.

Conclusion

Joshua Schmidt's contributions to optical measurement technology through his patent and work at Hi LLC demonstrate his commitment to innovation. His efforts are paving the way for advancements in the field, making significant impacts on how optical measurements are conducted.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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