The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Oct. 12, 2023
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Rong Jin, Acton, MA (US);

Sebastian Sorgenfrei, Playa Vista, CA (US);

Ryan Field, Culver City, CA (US);

Bruno Do Valle, Brighton, MA (US);

Jacob Dahle, Arlington, MA (US);

Assignee:

HI LLC, Culver City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0082 (2013.01); A61B 5/0073 (2013.01); A61B 5/0075 (2013.01); A61B 5/4064 (2013.01); A61B 5/6803 (2013.01); A61B 2560/0214 (2013.01);
Abstract

An illustrative optical measurement system includes a light source configured to emit light directed at a target. The optical measurement system further includes a photodetector configured to detect a photon of the light after the light is scattered by the target. The optical measurement system further includes a control circuit configured to receive a first input voltage that is a temperature-dependent voltage. The control circuit is further configured to receive a second input voltage that is a temperature-invariant voltage. The control circuit is further configured to output, based on a combination of the first input voltage and the second input voltage, a bias voltage for the photodetector, wherein the combination of the first and second input voltages is configured to cause the bias voltage to vary based on temperature.


Find Patent Forward Citations

Loading…