The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Feb. 07, 2022
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Michael Henninger, Austin, TX (US);

Ryan Field, Culver City, CA (US);

Han Yong Ban, Los Angeles, CA (US);

Assignee:

HI LLC, Culver City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1495 (2006.01); A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1495 (2013.01); A61B 5/14552 (2013.01); A61B 2560/0233 (2013.01);
Abstract

An illustrative optical measurement device includes a light source configured to emit light pulses directed at a target of a user. The optical measurement device further includes a detector configured to detect arrival times for photons of the light pulses after the photons are scattered by the target. The optical measurement device further includes a processing unit configured to determine, while the optical measurement device is being worn by the user, an instrument response function (IRF) associated with the optical measurement device. The processing unit is further configured to generate, based on the arrival times of the photons at the detector, histogram data associated with the target. The processing unit is further configured to determine, based on the IRF and the histogram data, a property of the target.


Find Patent Forward Citations

Loading…