Huerth, Germany

Ge Sensing & Inspection Technologies, Gmbh

USPTO Granted Patents = 50

% Expired Patents = 22.0


Trademarks = 13

Forward Citations = 195

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76 inventors (with patents filed for the assignee):

goldMedal Alexander Suppes (8 out of 17 patents)

silverMedal Eberhard Neuser (8 out of 13 patents)

bronzeMedal Nils Rothe (8 out of 15 patents)

4.  Reinhard Prause (7 out of 21 patents)

5.  Wolf-Dietrich Kleinert (6 out of 17 patents)

6.  Christof Breidenbach (5 out of 5 patents)

7.  Stephan Falter (5 out of 16 patents)

8.  Alexander Felix Fiseni (4 out of 21 patents)

9.  Ingo Stuke (4 out of 5 patents)

10.  Michael Wuestenbecker (4 out of 6 patents)

11.  York Oberdoerfer (4 out of 15 patents)

12.  Roman Heinrich Koch (3 out of 14 patents)

13.  Andreas Schmitt (3 out of 4 patents)

14.  Anja Frost (3 out of 4 patents)

15.  Marek Parusel (2 out of 2 patents)


Core Competencies:
Ultrasonic Testing
Computed Tomography
Non-Destructive Testing
Flaw Detection
Industrial Inspection
X-Ray Inspection
Ultrasound Probes
Condition Monitoring
Imaging Systems
Pattern Recognition
High-Voltage Connectors

50 patents:

Company Overview
Ge Sensing & Inspection Technologies, Gmbh, located in Huerth, Germany, specializes in advanced ultrasonic inspection technologies. The company focuses on non-destructive testing methods, including ultrasonic testing and computed tomography, to ensure the integrity and safety of industrial components. Their expertise extends to flaw detection, industrial inspection, and condition monitoring, utilizing cutting-edge techniques such as X-ray inspection and ultrasound probes to meet the rigorous demands of various industries.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

50 Patents

#1 in Huerth

#1,054 in Germany

#14,024 in the World

Huerth, DE
Huerth, Germany
Forward Citations = 195

76 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ge Sensing & Inspection Technologies, Gmbh. Retrieved from https://idiyas.com/company/ge-sensing-and-inspection-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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