The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Dec. 04, 2018
GE Inspection Technologies, Lp, Lewistown, PA (US);
Ralf Ratering, Bruehl, DE;
GE SENSING & INSPECTION TECHNOLOGIES, GMBH, Hürth, DE;
Abstract
Systems, methods, and computer readable mediums are provided for selecting a precise value within a large value range. Data received from an ultrasonic testing environment can include a range of values associated with one or more parameters to be configured for performing ultrasonic inspection of a test object. A control in a user interface of the ultrasonic testing environment can be provided and include a display portion displaying one or more parameters and one or more values within the range of values associated with the one or more parameters. The control also includes an interactive portion configured to receive a plurality of inputs. Based on the inputs a selected value associated with a first parameter can be determined. The selected value associated with the first parameter can be output as a static display within the display portion of the control.