The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Mar. 06, 2019
GE Sensing & Inspection Technologies Gmbh, Huerth, DE;
Michael Wuestenbecker, Ahrensburg, DE;
GE Sensing & Inspection Technologies GmbH, Hürth, DE;
Abstract
Systems, methods, and devices for determining relative and absolute positions and orientations of a detector and an inspection part of a CT system. In some cases positions/orientations of the detector and the inspection part can be defined, at least in part, by tilt angles relative to reference axes and/or planes defined by various combinations of the reference axes. In some embodiments, sensors coupled to the detector and to a stage assembly having the inspection part coupled thereto can be used to determine the tilt angles of the inspection part and the detector, respectively. Data from the sensors characterizing tilt angles of the detector and the inspection part can be used to adjust projectional radiographs of the inspection part to correct for the mechanical wobble of the stage. By using tilt data to adjust projectional radiographs, the quality of tomographic images and 3-dimensional reconstructions of the inspection part can be improved.