The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jun. 03, 2015
GE Sensing & Inspection Technologies Gmbh, Hurth, DE;
Roman Heinrich Koch, Alzenau, DE;
Stephan Falter, Huerth, DE;
Reinhard Prause, Huerth, DE;
Helmut Breidenbach, Huerth, DE;
Christof Breidenbach, Huerth, DE;
Thomas Weise, Huerth, DE;
GE SENSING & INSPECTION TECHNOLOGIES GMBH, Hurth, DE;
Abstract
A method for the nondestructive testing of a test object by ultrasound is provided, the method including generating a pulsed ultrasonic field in the test object by means of an array of individually drivable ultrasonic transmitting transducers acoustically coupled to the test object. The ultrasonic transmitting transducers are each driven with a specific analog transient excitation signal, wherein each analog transient excitation signal is generated based on an ultrasonic transmitting transducer-specific stored digital transient excitation function. The method further includes receiving resulting echo signals from the test object by means of an array of individually drivable ultrasonic receiving transducers, with each ultrasonic receiving transducer providing an analog time-resolved echo signal, temporarily storing the time-resolved, transducer-specific, digitized echo signals in the form of an echo signal set, and applying a plurality of different reception processing rules to the echo signal set.