The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
May. 21, 2021
GE Sensing & Inspection Technologies Gmbh, Hürth, DE;
Eberhard Neuser, Hürth, DE;
Alex Sawatzky, Hürth, DE;
Nils Rothe, Hürth, DE;
Alexander Suppes, Hürth, DE;
GE Sensing & Inspection Technologies GmbH, Hürth, DE;
Abstract
Systems and methods for non-destructive testing by computed tomography are provided. The system can include a stationary radiation source, a stage, and a plurality of stationary radiation detectors. The source can be configured to emit, from a focal point, a beam of penetrating radiation having a three-dimensional geometry and to direct the beam in a path incident upon a target. The stationary radiation source can be positioned with respect to the plurality of stationary radiation detectors and the stage such that, a first plurality of beam segment paths is defined between the focal point and respective sensing faces of the plurality of radiation detectors and at least one second beam segment path is defined between the focal point and a predetermined gap.