The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

Mar. 06, 2015
Applicant:

GE Sensing & Inspection Technolgies Gmbh, Hürth, DE;

Inventors:

Alexander Suppes, Wunstorf, DE;

Nils Rothe, Wunstorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01N 23/046 (2018.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/5282 (2013.01); G21K 1/02 (2013.01); G01N 2223/051 (2013.01); G01N 2223/316 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01);
Abstract

A method for imaging an object is presented. The method includes acquiring a first projection image of the object using a source and a detector, positioning a scatter rejecting aperture plate between the object and the detector, and acquiring a second projection image of the object with the scatter rejecting aperture plate disposed between the object and the detector. A scatter image of the object is generated based on the first projection image and the second projection image, and stored for subsequent imaging. A volumetric CT system for imaging an object is also presented. The system is configured to acquire a plurality of projection images of the object from a plurality of plurality of projection angles.


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