The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Jun. 03, 2019
GE Sensing & Inspection Technologies, Gmbh, Huerth, DE;
Alexander Fiseni, Hurth, DE;
Stephan Schmitz, Hurth, DE;
Christof Breidenbach, Hurth, DE;
Stephan Falter, Hurth, DE;
Daniel Koers, Hurth, DE;
Marek Parusel, Hurth, DE;
Lars Rohpeter, Hurth, DE;
Sven Runte, Hurth, DE;
Sebastian Standop, Hurth, DE;
GE SENSING & INSPECTION TECHNOLOGIES, GMBH, Hurth, DE;
Abstract
Systems and methods for monitoring the condition of ultrasonic transducers and ultrasonic probes used in non-destructive testing are provided. In one aspect, a degree of deterioration and end of life of an ultrasonic transducer can be estimated based upon measured environmental and/or operating parameters of the ultrasonic transducer. In another aspect, testing parameters acquired by a single ultrasonic probe or different ultrasonic probes can be measured and analyzed to identify deterioration of an ultrasonic probe.