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Migdal Haemek, Israel

Camtek Ltd.

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USPTO Granted Patents = 72

% Expired Patents = 18.1

Forward Citations = 98

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84 inventors (with patents filed for the assignee):

Menachem Regensburger (14 out of 15 patents)

Shimon Koren (12 out of 12 patents)

Zehava Ben Ezer (6 out of 6 patents)

4. Zehava Ben-Ezer (5 out of 5 patents)

5. Yuri Postolov (5 out of 5 patents)

6. Gilad Golan (5 out of 7 patents)

7. Tomer Gilad (4 out of 4 patents)

8. Roni Flieswasser (4 out of 4 patents)

9. Yosi Cherbis (4 out of 4 patents)

10. Mordi Dahan (4 out of 4 patents)

11. Carmel Yehuda Drillman (4 out of 4 patents)

12. Moshe Edri (4 out of 4 patents)

13. Daniel Buzaglo (3 out of 3 patents)

14. Eyal Segev (3 out of 3 patents)

15. Eldad Langmans (3 out of 3 patents)

Core Competencies:

Defect Detection

Wafer Inspection

Metrology

Edge Inspection

Optical Inspection

Deep Learning

Height Measurements

Crystallographic Defects

Triangulation System

Automatic Classification

Illumination Techniques

72 patents: Sort by Forward Citations

1. 12631440 - Continuous bump measurement height metrology (2026-05-19),

2. 12474162 - Bump measurement height metrology (2025-11-18),

3. 12467737 - Self-referencing interferometric microscope (2025-11-11),

4. 12332176 - Dark field illumination based on laser illuminated phosphor (2025-06-17),

5. 12320757 - Semiconductor inspection tool system and method for wafer edge inspection (2025-06-03),

6. 12315206 - Inspection system for edge and bevel inspection of semiconductor structures (2025-05-27),

7. 12292374 - Crystallographic defect inspection (2025-05-06),

8. 12020417 - Method and system for classifying defects in wafer using wafer-defect images, based on deep learning (2024-06-25),

9. 11927545 - Semiconductor edge and bevel inspection tool system (2024-03-12),

10. 11828713 - Semiconductor inspection tool system and method for wafer edge inspection (2023-11-28),

11. 11682584 - Measuring buried layers (2023-06-20),

12. 11300521 - Automatic defect classification (2022-04-12),

13. 11055836 - Optical contrast enhancement for defect inspection (2021-07-06),

14. 11047807 - Defect detection (2021-06-29),

15. 10989670 - Detection of pits using an automatic optical inspection system (2021-04-27),

Company Overview

Camtek Ltd. is a leading provider of advanced inspection and metrology solutions for the semiconductor industry, headquartered in Migdal Haemek, Israel. The company specializes in technologies that enhance defect detection and wafer inspection, employing cutting-edge methods such as optical inspection and deep learning. Camtek's innovations focus on critical areas like edge inspection and height measurements, addressing the growing need for precision in semiconductor manufacturing and ensuring high-quality production standards.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

72 Patents

#2 in Migdal Haemek

#84 in Israel

#10,396 in the World

Migdal Haemek, Israel

Camtek Ltd.

Forward Citations = 98

84 inventors:

Menachem Regensburger (14 out of 15 patents)

Shimon Koren (12 out of 12 patents)

Zehava Ben Ezer (6 out of 6 patents)

4. Zehava Ben-Ezer (5 out of 5 patents)

5. Yuri Postolov (5 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Camtek Ltd.. Retrieved from https://idiyas.com/company/camtek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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