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Migdal Haemek, Israel

Camtek Ltd.

USPTO Granted Patents = 72

% Expired Patents = 18.1

Forward Citations = 98

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84 inventors (with patents filed for the assignee):

Menachem Regensburger (14 out of 15 patents)

Shimon Koren (12 out of 12 patents)

Zehava Ben Ezer (6 out of 6 patents)

4. Zehava Ben-Ezer (5 out of 5 patents)

5. Yuri Postolov (5 out of 5 patents)

6. Gilad Golan (5 out of 7 patents)

7. Tomer Gilad (4 out of 4 patents)

8. Roni Flieswasser (4 out of 4 patents)

9. Yosi Cherbis (4 out of 4 patents)

10. Mordi Dahan (4 out of 4 patents)

11. Carmel Yehuda Drillman (4 out of 4 patents)

12. Moshe Edri (4 out of 4 patents)

13. Daniel Buzaglo (3 out of 3 patents)

14. Eyal Segev (3 out of 3 patents)

15. Eldad Langmans (3 out of 3 patents)

Core Competencies:

Defect Detection

Wafer Inspection

Metrology

Edge Inspection

Optical Inspection

Deep Learning

Height Measurements

Crystallographic Defects

Triangulation System

Automatic Classification

Illumination Techniques

72 patents: Sort by Forward Citations

1. 12631440 - Continuous bump measurement height metrology (2026-05-19),

2. 12474162 - Bump measurement height metrology (2025-11-18),

3. 12467737 - Self-referencing interferometric microscope (2025-11-11),

4. 12332176 - Dark field illumination based on laser illuminated phosphor (2025-06-17),

5. 12320757 - Semiconductor inspection tool system and method for wafer edge inspection (2025-06-03),

6. 12315206 - Inspection system for edge and bevel inspection of semiconductor structures (2025-05-27),

7. 12292374 - Crystallographic defect inspection (2025-05-06),

8. 12020417 - Method and system for classifying defects in wafer using wafer-defect images, based on deep learning (2024-06-25),

9. 11927545 - Semiconductor edge and bevel inspection tool system (2024-03-12),

10. 11828713 - Semiconductor inspection tool system and method for wafer edge inspection (2023-11-28),

11. 11682584 - Measuring buried layers (2023-06-20),

12. 11300521 - Automatic defect classification (2022-04-12),

13. 11055836 - Optical contrast enhancement for defect inspection (2021-07-06),

14. 11047807 - Defect detection (2021-06-29),

15. 10989670 - Detection of pits using an automatic optical inspection system (2021-04-27),

Camtek Ltd is a leading provider of automated and technologically advanced solutions for the semiconductor industry. With over 35 years of experience, Camtek offers a wide range of inspection and metrology systems that increase yield and productivity in semiconductor manufacturing processes. The company’s innovative solutions enable customers to improve their production efficiency while maintaining high-quality standards. Headquartered in Migdal HaEmek, Israel, Camtek operates globally with offices and service centers in North America, Europe, and Asia.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

72 Patents

#2 in Migdal Haemek

#84 in Israel

#10,365 in the World

Migdal Haemek, Israel

Camtek Ltd.

Forward Citations = 98

84 inventors:

Menachem Regensburger (14 out of 15 patents)

Shimon Koren (12 out of 12 patents)

Zehava Ben Ezer (6 out of 6 patents)

4. Zehava Ben-Ezer (5 out of 5 patents)

5. Yuri Postolov (5 out of 5 patents)

Please report any incorrect information to [email protected]

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