The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jul. 11, 2021
Applicant:
Camtek Ltd., Migdal-Haemek, IL;
Inventor:
Eyal Segev, Atlit, IL;
Assignee:
CAMTEK Ltd., Migdal-Haemek, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01N 21/95 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0633 (2013.01); G01B 11/06 (2013.01); G01B 11/0608 (2013.01); G01B 11/0625 (2013.01); G01B 11/0675 (2013.01); G01N 21/9501 (2013.01); G01N 21/956 (2013.01); G01B 2210/50 (2013.01); G01B 2210/56 (2013.01);
Abstract
A method for measuring height differences between tops of multiple bumps of an upper surface of a layer, the method may include performing first measurements of the height differences between the bumps and the corresponding areas, by illuminating the bumps and the corresponding areas with first radiation; wherein the first measurements are subjected to first measurement errors; and determining the height differences between the bumps and the corresponding areas based on the first measurements and the first measurements errors.