Tomer Gilad

Title: The Innovative Contributions of Tomer Gilad

Introduction

Tomer Gilad is a notable inventor based in Kiryat Tivon, Israel. He has made significant contributions to the field of microscopy and semiconductor inspection, holding a total of 4 patents. His work is characterized by innovative approaches that enhance imaging techniques and inspection systems.

Latest Patents

One of Tomer Gilad's latest patents is the self-referencing interferometric microscope. This device utilizes near-common-path, common component beam separators to create two beams that illuminate a sample from different angles. The two return beams collected from the sample interfere at the image plane, producing an interferometric image that reveals the sample's topography through visible fringes.

Another significant patent is for an inspection system designed for semiconductor substrates. This system includes an inspection unit that features both a partially blocking bright field unit and a non-blocking bright field unit. The partially blocking unit is engineered to block specific specular reflections, while the non-blocking unit allows certain reflections to pass through to the image plane, ensuring accurate inspection of the wafer.

Career Highlights

Tomer Gilad is currently employed at Camtek Ltd., a company known for its advanced inspection and metrology solutions. His role at Camtek has allowed him to apply his innovative ideas in practical applications, contributing to the company's reputation in the industry.

Collaborations

Throughout his career, Tomer has collaborated with talented individuals such as Shimon Koren and Zehava Ben Ezer. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Tomer Gilad's contributions to the fields of microscopy and semiconductor inspection demonstrate his innovative spirit and technical expertise. His patents reflect a commitment to advancing technology and improving inspection methodologies.