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Fremont, CA, United States of America

Asm Nutool, Inc.

USPTO Granted Patents = 42

% Expired Patents = 38.1

Forward Citations = 2,065

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23 inventors (with patents filed for the assignee):

Bulent Mehmet Basol (31 out of 161 patents)

Homayoun Talieh (26 out of 104 patents)

Cyprian Emeka Uzoh (17 out of 431 patents)

4. Douglas W Young (8 out of 32 patents)

5. Jalal Ashjaee (7 out of 23 patents)

6. Konstantin Volodarsky (6 out of 23 patents)

7. Efrain A Velazquez (4 out of 9 patents)

8. Yuchun Wang (3 out of 31 patents)

9. Rimma Volodarsky (3 out of 7 patents)

10. Bernard Frey (2 out of 21 patents)

11. Boguslaw Nagorski (2 out of 8 patents)

12. Halit N Yakupoglu (2 out of 3 patents)

13. Jeffrey A Bogart (2 out of 6 patents)

14. Mukesh Desai (2 out of 2 patents)

15. Brett E McGrath (2 out of 2 patents)

Core Competencies:

Electrochemical Processing

Defect Reduction

Interconnect Structures

Chemical Mechanical Polishing

Wafer Processing

Thin Film Deposition

Endpoint Detection

Plating Methods

Material Removal Techniques

Multi-Level Metallization

Uniformity Improvement

Electrical Contact Formation

42 patents: Sort by Forward Citations

1. 7625814 - Filling deep features with conductors in semiconductor manufacturing (2009-12-01),

2. 7485561 - Filling deep features with conductors in semiconductor manufacturing (2009-02-03),

3. 7189146 - Method for reduction of defects in wet processed layers (2007-03-13),

4. 7172497 - Fabrication of semiconductor interconnect structures (2007-02-06),

5. 7147766 - Chip interconnect and packaging deposition methods and structures (2006-12-12),

6. 7141146 - Means to improve center to edge uniformity of electrochemical mechanical processing of workpiece surface (2006-11-28),

7. 7129165 - Method and structure to improve reliability of copper interconnects (2006-10-31),

8. 7122473 - Edge and bevel cleaning process and system (2006-10-17),

9. 7115510 - Method for electrochemically processing a workpiece (2006-10-03),

10. 7101471 - Method for planar material removal technique using multi-phase process environment (2006-09-05),

11. 7097755 - Electrochemical mechanical processing with advancible sweeper (2006-08-29),

12. 7097538 - Advanced chemical mechanical polishing system with smart endpoint detection (2006-08-29),

13. 7064057 - Method and apparatus for localized material removal by electrochemical polishing (2006-06-20),

14. 7059944 - Integrated system for processing semiconductor wafers (2006-06-13),

15. 7045040 - Process and system for eliminating gas bubbles during electrochemical processing (2006-05-16),

Company Overview

Asm Nutool, Inc., based in Fremont, CA, specializes in advanced semiconductor manufacturing technologies. The company focuses on electrochemical mechanical processing, chemical mechanical polishing, and thin film processing, which are critical for enhancing the performance and reliability of semiconductor devices. Their expertise extends to wafer processing, interconnect structures, endpoint detection, and defect reduction techniques, positioning them as a key player in the semiconductor industry, dedicated to innovation and precision in manufacturing processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

42 Patents

#54 in Fremont, CA

#1,941 in California

#8,258 in US

#16,354 in the World

Fremont, CA, United States of America

Asm Nutool, Inc.

Forward Citations = 2,065

23 inventors:

Bulent Mehmet Basol (31 out of 161 patents)

Homayoun Talieh (26 out of 104 patents)

Cyprian Emeka Uzoh (17 out of 431 patents)

4. Douglas W Young (8 out of 32 patents)

5. Jalal Ashjaee (7 out of 23 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Asm Nutool, Inc.. Retrieved from https://idiyas.com/company/asm-nutool

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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