The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2006

Filed:

Jun. 01, 2004
Applicants:

Bulent M. Basol, Manhattan Beach, CA (US);

Homayoun Talieh, San Jose, CA (US);

Inventors:

Bulent M. Basol, Manhattan Beach, CA (US);

Homayoun Talieh, San Jose, CA (US);

Assignee:

ASM Nutool, Inc., Phoenix, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/4763 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of forming a conductor structure on a surface of a wafer is provided. The surface of the wafer includes cavities separated by field regions. Initially, a barrier layer is deposited on the surface that includes cavities separated by field regions. A thin seed layer with a substantially uniform thickness is deposited on the barrier layer. The barrier layer and the seed layer portions in the cavities occupy less than 30% of the volume of each cavity. The remaining volume of each cavity is filled with a conductive material which is formed on the seed layer. The conductive layer has a substantially small thickness. After forming the conductive layer, the wafer is annealed to increase grain size in the conductive layer and the seed layer.

Published as:

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