The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Feb. 08, 2023
Nanchang University, Nanchang, CN;
Huibin Qiu, Nanchang, CN;
Zuozhi Hu, Nanchang, CN;
Donghua Xiao, Nanchang, CN;
Shengfa Wu, Nanchang, CN;
Chengjie Zhong, Nanchang, CN;
Jiangcun Chen, Nanchang, CN;
Chaozhe Hu, Nanchang, CN;
Xiaobin Li, Nanchang, CN;
Junjie Wu, Nanchang, CN;
Junhui Liu, Nanchang, CN;
Yizhen Bao, Nanchang, CN;
Xiaoyang Zhang, Nanchang, CN;
Runrui Dai, Nanchang, CN;
Lihuan Liu, Nanchang, CN;
Jianing Xu, Nanchang, CN;
Xu Tu, Nanchang, CN;
Juecong Zhang, Nanchang, CN;
Peng Guo, Nanchang, CN;
Shuyu Long, Nanchang, CN;
Huang Weng, Nanchang, CN;
Chenyu Tong, Nanchang, CN;
Sanqiu Liu, Nanchang, CN;
NANCHANG UNIVERSITY, Nanchang, CN;
Abstract
The present invention relates to a method for measuring the ion nonextensive parameter of plasma includes the following steps: describe the plasma with nonextensive statistical mechanics, obtain the equation describing the relationship between the geodesic acoustic mode frequency and the ion acoustic speed of plasma; collect the measurement data of the geodesic acoustic mode frequencies and plasma temperature in the device where the plasma is to be measured; the obtained equation describing the relationship between the geodesic acoustic mode frequency and the ion acoustic speed of plasma is used to linearly fit the collected measured data of the geodesic acoustic mode frequency and the plasma temperature in the device where the plasma is to be measured to obtain the slope value; based on the derived equation and the obtained slope values, and combining with the safety factor of the device where the plasma is to be measured, the ion nonextensive parameter is solved numerically. The present invention fills the gap where the electron nonextensive parameter can be measured with the nonextensive single electric probe, but the corresponding ion nonextensive parameter cannot be diagnosed yet in the field of nonextensive parameters diagnosis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile