This inventor holds 1 USPTO granted patent. Top assignee: Nanchang University. Active years: 2023.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2023
Title: Jiangcun Chen: Innovator in Plasma Measurement Technology
Introduction
Jiangcun Chen is a notable inventor based in Nanchang, China. He has made significant contributions to the field of plasma measurement technology. His innovative approach has led to the development of a unique method for measuring the ion nonextensive parameter of plasma.
Latest Patents
Jiangcun Chen holds a patent titled "Method for measuring plasma ion nonextensive parameter." This invention describes a method that utilizes nonextensive statistical mechanics to measure the ion nonextensive parameter of plasma. The process involves several steps, including obtaining equations that relate geodesic acoustic mode frequency to ion acoustic speed, collecting measurement data, and numerically solving for the ion nonextensive parameter. This invention addresses a critical gap in the diagnosis of ion nonextensive parameters, complementing existing methods for measuring electron nonextensive parameters.
Career Highlights
Jiangcun Chen is affiliated with Nanchang University, where he continues to advance research in plasma physics. His work has garnered attention for its innovative approach and practical applications in the field. With a focus on enhancing measurement techniques, Chen's contributions are paving the way for further advancements in plasma diagnostics.
Collaborations
Jiangcun Chen has collaborated with notable colleagues, including Huibin Qiu and Zuozhi Hu. Their joint efforts have contributed to the development of innovative solutions in plasma measurement and research.
Conclusion
Jiangcun Chen's work exemplifies the spirit of innovation in the field of plasma measurement technology. His patented method not only fills a significant gap in the field but also showcases the potential for further advancements in plasma diagnostics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile