Tokyo, Japan

Yuya Toyoshima


Average Co-Inventor Count = 5.6

ph-index = 2

Forward Citations = 14(Granted Patents)


Location History:

  • Tokyo, JP (2005 - 2009)
  • Sendai, JP (2009)

Company Filing History:


Years Active: 2005-2009

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5 patents (USPTO):

Title: The Innovative Mind of Yuya Toyoshima

Introduction

Yuya Toyoshima, a prominent inventor based in Tokyo, Japan, has made significant contributions to the field of semiconductor technology. With a total of five patents to his name, his work reflects a blend of creativity and technical expertise, particularly in the area of measuring the three-dimensional shapes of fine patterns on semiconductor devices.

Latest Patents

Among his latest innovations, Yuya Toyoshima has developed a "Method for measuring three dimensional shape of a fine pattern." This method employs an optical measurement system to obtain critical cross-section information, while utilizing an electron microscope to capture detailed images of fine patterns. By combining plane information and cross-section information, this approach enables the precise measurement of intricate shapes found in semiconductor manufacturing.

Another notable patent is the "Sample dimension-measuring method and charged particle beam apparatus." This invention provides a streamlined approach for executing two types of measurements using both an optical measuring device and a scanning electron microscope. The method not only calculates dimensional values for a range of feature objects but also determines measurement offsets for enhanced accuracy, thus bridging the gap between different measurement systems.

Career Highlights

Yuya Toyoshima is currently affiliated with Hitachi High-Technologies Corporation, wherein he continues to push the boundaries of innovation in the semiconductor industry. His career at this esteemed organization has allowed him to refine his skills and contribute to pivotal advancements in measurement technologies for semiconductor devices.

Collaborations

Throughout his career, Toyoshima has had the opportunity to collaborate with esteemed colleagues, waaronder Tadashi Otaka and Yasuhiro Mitsui. These partnerships have facilitated the exchange of ideas and led to the successful development of various patented technologies.

Conclusion

Yuya Toyoshima stands out as a leading inventor in his field, showcasing how innovation can transform the semiconductor industry. With his recent patents and ongoing projects, he continues to establish a legacy of excellence and ingenuity, influencing the future of measurement technologies in a rapidly advancing world.

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