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For the Inventor, By the Inventor

Taipei, Taiwan

Yun-Chin Li

This inventor holds 24 USPTO granted patents and 4 published patent applications, primarily in Image Processing Technology. Top assignees: Altek Corporation, Altek Semiconductor Corp., Other. Active years: 2010-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun-Chin Li. Retrieved from https://idiyas.com/inventor/yun-chin-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 24 

% Patents Active = 66.7

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 26(Granted Patents)


Location History:

  • Banciao, TW (2010 - 2012)
  • Taipei County, TW (2011 - 2013)
  • New Taipei, TW (2013 - 2016)
  • Hsinchu, TW (2018 - 2023)

Company Filing History:

goldMedal15 out of 259 
 
Altek Corporation
 patents
silverMedal8 out of 49 
 
Altek Semiconductor Corp.
 patents
bronzeMedal1 out of 834,513 
Other
 patents

Years Active: 2010-2023

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Areas of Expertise:
Dual Sensor Imaging
Image Calibration
Depth Map Calculation
Image Synthesis
Phase Detection Autofocus
Optimum Image Selection
Three Dimensional Imaging
Anti-Shake System
Image Compensation
Movement Compensation
Exposure Time Adjusting
Privacy Protection Imaging
24 patents (USPTO):Explore Patents
1. 11689822 - Dual sensor imaging system and privacy protection imaging method thereof (2023-06-27),
2. 11568526 - Dual sensor imaging system and imaging method thereof (2023-01-31),
3. 11496694 - Dual sensor imaging system and imaging method thereof (2022-11-08),
4. 11496660 - Dual sensor imaging system and depth map calculation method thereof (2022-11-08),
5. 11418719 - Dual sensor imaging system and calibration method which includes a color sensor and an infrared ray sensor to perform image alignment and brightness matching (2022-08-16),
6. 10235773 - Image capturing device and calibration method of phase detection autofocus thereof (2019-03-19),
7. 10165248 - Optimization method of image depth information and image processing apparatus (2018-12-25),
8. 9426370 - Image capturing device and exposure time adjusting method thereof (2016-08-23),
9. 9179070 - Method for adjusting focus position and electronic apparatus (2015-11-03),
10. 8922678 - Electronic apparatus, image capturing apparatus, and method thereof (2014-12-30),
11. 8902289 - Method for capturing three dimensional image (2014-12-02),
12. 8810634 - Method and apparatus for generating image with shallow depth of field (2014-08-19),
13. 8760530 - Image capturing apparatus, image capturing method and electronic apparatus (2014-06-24),
14. 8643731 - Image capturing device, control method thereof, and electronic device having the image capturing device (2014-02-04),
15. 8593508 - Method for composing three dimensional image with long focal length and three dimensional imaging system (2013-11-26),

Title: Inventor Yun-Chin Li: Revolutionizing Technology in New Taipei

Introduction: Yun-Chin Li is a visionary inventor based in New Taipei, Taiwan, known for his groundbreaking contributions to the field of technology.

Latest Patents: Yun-Chin Li holds several patents in the areas of artificial intelligence, robotics, and renewable energy technologies, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Yun-Chin Li has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have had a significant impact on various industries.

Collaborations: Throughout his career, Yun-Chin Li has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and knowledge sharing.

Conclusion: Yun-Chin Li's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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