The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Mar. 04, 2021
Altek Semiconductor Corp., Hsinchu, TW;
Shih-Yuan Peng, Hsinchu, TW;
Shu-Chun Cheng, Hsinchu, TW;
Hsu-Lien Huang, Taipei, TW;
Yun-Chin Li, Hsinchu, TW;
Kuo-Ming Lai, Hsinchu, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
A dual sensor imaging system and a calibration method thereof are provided. The dual sensor imaging system includes at least one color sensor, at least one infrared ray (IR) sensor, a storage device, and a processor. The processor is configured to load and execute a computer program stored in the storage device to: control the color sensor and the IR sensor to respectively capture multiple color images and multiple IR images of an imaging scene by adopting multiple capturing conditions; calculate multiple color image parameters of the color image captured under each capturing condition and multiple IR image parameters of the IR image captured under each capturing condition to be used to calculate a difference between a brightness of the color image and a brightness of the IR image; and determine an exposure setting suitable for the color sensor and the IR sensor according to the calculated difference.