The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Mar. 29, 2021
Altek Semiconductor Corp., Hsinchu, TW;
Shih-Yuan Peng, Hsinchu, TW;
Shu-Chun Cheng, Hsinchu, TW;
Hsu-Lien Huang, Taipei, TW;
Yun-Chin Li, Hsinchu, TW;
Kuo-Ming Lai, Hsinchu, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
A dual sensor imaging system and a depth map calculation method thereof are provided. The dual sensor imaging system includes at least one color sensor, at least one infrared ray (IR) sensor, a storage device, and a processor. The processor is configured to load and execute a computer program stored in the storage device to: control the color sensor and the IR sensor to respectively capture multiple color images and multiple IR images by adopting multiple exposure conditions suitable for an imaging scene, adaptively select a combination of the color image and the IR image that are comparable to each other from the color images and the IR images; and calculate a depth map of the imaging scene by using the selected color image and IR image.