The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Mar. 29, 2021
Altek Semiconductor Corp., Hsinchu, TW;
Shih-Yuan Peng, Hsinchu, TW;
Shu-Chun Cheng, Hsinchu, TW;
Hsu-Lien Huang, Taipei, TW;
Yun-Chin Li, Hsinchu, TW;
Kuo-Ming Lai, Hsinchu, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
A dual sensor imaging system and an imaging method thereof are provided. The method includes: identifying an imaging scene; controlling a color sensor and an IR sensor to respectively capture color images and IR images by adopting capturing conditions suitable for the imaging scene; calculating a signal-to-noise ratio (SNR) difference between each color image and the IR images, and a luminance mean value of each color image; selecting the color image and IR image captured under capturing conditions of having the SNR difference less than an SNR threshold and the luminance mean value greater than a luminance threshold to execute a feature domain transformation to extract partial details of the imaging scene; and fusing the selected color image and IR image to adjust the partial details of the color image according to a guidance of the partial details of the IR image to obtain a scene image with full details.