The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Aug. 29, 2013
Applicant:
Altek Semiconductor Corp., Hsinchu, TW;
Inventors:
Assignee:
Altek Semiconductor Corp., Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06K 9/40 (2006.01); G03B 3/00 (2006.01); H04N 5/262 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23293 (2013.01); H04N 5/23212 (2013.01); H04N 5/23229 (2013.01); H04N 5/2621 (2013.01);
Abstract
A method for adjusting focus position and an electronic apparatus are provided. Herein, a depth map is obtained according to a first image and a second image which are captured by a first lens and a second lens, respectively. A plurality of depth values included in the depth map is compared with a depth of field (DOF) table for obtaining a plurality of focus distances. An All-in-Focus (AIF) image is generated according to a plurality of focus images captured by the first lens with the focus distances, respectively. A blur process is executed for a plurality of pixels excluding a focus selected location in the AIF image, so as to obtain an adjusting image.