Tokyo, Japan

Yuko Otani

This inventor holds 22 USPTO granted patents and 8 published patent applications and 1 EPO patent, primarily in Defect Detection Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, The University of Tokyo. Active years: 2015-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuko Otani. Retrieved from https://idiyas.com/inventor/yuko-otani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 22 

% Patents Active = 81.8

 

Average Co-Inventor Count = 3.6

ph-index = 3

Forward Citations = 37(Granted Patents)


Location History:

  • Tokyo, JE (2017)
  • Tokyo, JP (2015 - 2024)

Company Filing History:


Years Active: 2015-2026

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Areas of Expertise:
Optical Filtering
MEMS Shutter
Microscope System
Inspection Device
Defect Detection
Defect Observation
Electrochemical Device
Composite Particles
Lysophosphatidylserine
Defect Reviewing
Observation Apparatus
Defect Inspection
22 patents (USPTO):Explore Patents

Title: Yuko Otani: Innovator in Defect Detection Technology

Introduction

Yuko Otani is a notable inventor based in Tokyo, Japan, who has made significant contributions to the field of defect detection technology. With a remarkable portfolio of 19 patents, his innovations are pivotal for industries reliant on precision and accuracy.

Latest Patents

Yuko Otani's latest patents focus on advanced defect detection mechanisms. One such patent, a defect detection device, includes an illumination optical system and an image capturing optical system. This device captures images of the scattered light generated by illuminating a wafer. The innovation comprises an image processing unit that effectively analyzes the scattered light images to identify defects on the wafer. Notably, the device encompasses a comprehensive optical system, featuring a microlens array and a mask image storage unit, allowing high-speed and sensitive detection of various defect types.

Another of his significant patents includes a defect observation apparatus that integrates similar technologies to enhance defect detection using a compact optical system. This combination increases the device's efficiency and accuracy, making it an important tool in semiconductor manufacturing and other applications.

Career Highlights

Throughout his career, Yuko Otani has worked with renowned organizations such as Hitachi High-Technologies Corporation and The University of Tokyo. His contributions in these roles have not only advanced defect detection technologies but also enhanced institutional research capabilities.

Collaborations

Yuko has collaborated with esteemed colleagues Toshifumi Honda and Shunichi Matsumoto, enriching his projects with diverse expertise. These collaborations have contributed to innovative solutions in the realm of optical systems and defect detection methodologies.

Conclusion

Yuko Otani's innovative work continues to push the boundaries of defect detection technology. His array of patents exemplifies his commitment to enhancing industry standards and capabilities, making him a key figure in this specialized field. With ongoing advancements, his inventions promise to play an integral role in future technological applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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