Tokyo, Japan

Yuko Otani

USPTO Granted Patents = 19 

 

Average Co-Inventor Count = 3.7

ph-index = 3

Forward Citations = 32(Granted Patents)


Location History:

  • Tokyo, JE (2017)
  • Tokyo, JP (2015 - 2024)

Company Filing History:


Years Active: 2015-2024

where 'Filed Patents' based on already Granted Patents

19 patents (USPTO):

Title: Yuko Otani: Innovator in Defect Detection Technology

Introduction

Yuko Otani is a notable inventor based in Tokyo, Japan, who has made significant contributions to the field of defect detection technology. With a remarkable portfolio of 19 patents, his innovations are pivotal for industries reliant on precision and accuracy.

Latest Patents

Yuko Otani's latest patents focus on advanced defect detection mechanisms. One such patent, a defect detection device, includes an illumination optical system and an image capturing optical system. This device captures images of the scattered light generated by illuminating a wafer. The innovation comprises an image processing unit that effectively analyzes the scattered light images to identify defects on the wafer. Notably, the device encompasses a comprehensive optical system, featuring a microlens array and a mask image storage unit, allowing high-speed and sensitive detection of various defect types.

Another of his significant patents includes a defect observation apparatus that integrates similar technologies to enhance defect detection using a compact optical system. This combination increases the device's efficiency and accuracy, making it an important tool in semiconductor manufacturing and other applications.

Career Highlights

Throughout his career, Yuko Otani has worked with renowned organizations such as Hitachi High-Technologies Corporation and The University of Tokyo. His contributions in these roles have not only advanced defect detection technologies but also enhanced institutional research capabilities.

Collaborations

Yuko has collaborated with esteemed colleagues Toshifumi Honda and Shunichi Matsumoto, enriching his projects with diverse expertise. These collaborations have contributed to innovative solutions in the realm of optical systems and defect detection methodologies.

Conclusion

Yuko Otani's innovative work continues to push the boundaries of defect detection technology. His array of patents exemplifies his commitment to enhancing industry standards and capabilities, making him a key figure in this specialized field. With ongoing advancements, his inventions promise to play an integral role in future technological applications.

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