Tokyo, Japan

Yuichiro Yamazaki

This inventor holds 64 USPTO granted patents and 2 EPO patents, primarily in Electron Beam Inspection (CPC class H01J). Top assignees: Kabushiki Kaisha Toshiba, Ebara Corporation, Ngr Limited. Active years: 1990-2022.


% Patents Active = 65.6

 

Average Co-Inventor Count = 3.8

ph-index = 20

Forward Citations = 1,153(Granted Patents)

Forward Citations (Not Self Cited) = 1,100(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Edogawa, JP (1994)
  • Edogawa-ku, JP (1997 - 2001)
  • Tokyo-To, JP (1996 - 2004)
  • Toyko, JP (2011)
  • Tokyo, JP (1992 - 2016)
  • Yokohama, JP (1990 - 2022)

Company Filing History:


Years Active: 1990-2022

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Areas of Expertise:
Electron Beam Apparatus
Charged Particle Beam
Semiconductor Device
Inspection System
Pattern Inspection
Defect Inspection
Mapping-Projection Type
Substrate Inspection
Thickness Measuring
Energy Spectrum Measurement
Photomask Repair
Process Condition Determination
64 patents (USPTO):Explore Patents

Title: Innovation and Impact: The Patents of Yuichiro Yamazaki

Introduction

Yuichiro Yamazaki, based in Tokyo, Japan, is a distinguished inventor with an impressive portfolio of 64 patents. His work primarily revolves around advanced electron microscopy and electron beam technologies, contributing significantly to the field of energy spectrum analysis.

Latest Patents

Among his latest inventions, Yamazaki developed an "Apparatus and method for measuring energy spectrum of backscattered electrons." This invention provides a sophisticated system to analyze the energy of backscattered electrons generated from a specimen. The apparatus is composed of an electron beam source, an electron optical system, and an energy analyzing system, which collectively enhance the precision of energy spectrum detection.

Another notable patent is the "Secondary particle detection system of a scanning electron microscope." This invention encompasses a scanning electron microscope that utilizes a retarding power source, a combined objective lens, and a dual scintillation detector setup. This design allows for the efficient detection of secondary electrons, thus improving the accuracy and reliability of measurements in electron microscopy.

Career Highlights

Throughout his career, Yamazaki has been associated with reputable companies such as Kabushiki Kaisha Toshiba and Ebara Corporation. His role in these organizations has been pivotal in shaping the technological advancements in electron beam technologies and applications.

Collaborations

Yamazaki has collaborated with other notable professionals, including Ichirota Nagahama and Motosuke Miyoshi. These collaborations have fostered a dynamic exchange of ideas and innovations, enhancing the quality and impact of their collective work in the field of electron microscopy.

Conclusion

Yuichiro Yamazaki's contributions to the field of innovations and inventions are substantial. With his extensive patent portfolio and collaborative spirit, he continues to drive advancements in electron microscopy and energy analysis technologies. His work serves as an inspiration for future inventors and a testament to the impact of creativity and engineering in modern science.

Profile summary based on public USPTO records.
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