Tokyo, Japan

Yuichi Abe

This inventor holds 67 USPTO granted patents and 22 published patent applications, plus 1 CIPO patent and 1 EPO patent, primarily in Pattern Matching Technology (CPC class G06T). Top assignees: Sony Corporation, Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation. Active years: 1996-2026.

USPTO Granted Patents = 67 

% Patents Active = 55.2


 

Average Co-Inventor Count = 3.6

ph-index = 11

Forward Citations = 445(Granted Patents)

Forward Citations (Not Self Cited) = 430(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Hachioji, JP (1998 - 2000)
  • Hitachi, JP (1999 - 2004)
  • Fuchu, JP (2010)
  • Hitachinaka, JP (2014)
  • Mito, JP (2011 - 2020)
  • Tokyo, JP (1996 - 2023)

Company Filing History:


Years Active: 1996-2026

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Areas of Expertise:
Pattern Matching
Image Processing
Inspection Apparatus
Machine Learning
Content Playback
Semiconductor Inspection
Automated Analysis
Radar Device
Template Matching
Data Display
Content Sharing
Chronology Providing
67 patents (USPTO):Explore Patents

Title: A Deep Dive into the Innovations of Yuichi Abe

Introduction

Yuichi Abe, a prominent inventor based in Tokyo, Japan, has made significant contributions to the field of technology, holding an impressive 63 patents. His work primarily focuses on advanced pattern matching and image evaluation techniques, showcasing his commitment to pushing the boundaries of innovation.

Latest Patents

Among his latest patents, Abe developed a **Pattern Matching Device and Computer Program for Pattern Matching**. This innovative solution aims to achieve highly accurate positioning even when edge positions and numbers change. The invention details a method where multiple edges in the first pattern data are associated with edges in the second pattern data, allowing for various association combinations that are evaluated using index values. This leads to effective matching processing through the selection of optimal combinations based on evaluations.

Another noteworthy patent is the **Image Evaluation Method and Image Evaluation Device**. This invention includes components such as a design data image generation unit, a machine learning unit that models the design data image creation, and a comparison unit that assesses the quality of generated images. This method provides a way to detect systematic defects without relying on defect images, thus reducing the chances of misinformation.

Career Highlights

Yuichi Abe’s career includes significant stints at renowned companies such as Sony Corporation and Hitachi High-Technologies Corporation. His work at these companies has undoubtedly aided in the development of technologies that enhance image processing and pattern recognition.

Collaborations

Throughout his career, Abe has collaborated with esteemed colleagues, including Yoichiro Sako and Mitsuru Takehara. These collaborations have played a pivotal role in fostering innovation and exploring new technological frontiers within the industry.

Conclusion

The inventive spirit of Yuichi Abe illustrates the power of innovation in tackling complex technological challenges. With an extensive portfolio of patents and a dedication to advancing pattern matching and image evaluation technologies, Abe continues to inspire future generations of inventors and innovators. His contributions not only enhance current systems but also pave the way for future advancements in technological applications.

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