The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Feb. 20, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Liang Li, Tokyo, JP;

Yuichi Abe, Tokyo, JP;

Wataru Nagatomo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/12 (2017.01); G06V 10/44 (2022.01); G06V 10/60 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 7/12 (2017.01); G06V 10/44 (2022.01); G06V 10/60 (2022.01); G06V 10/7515 (2022.01); G06V 10/757 (2022.01); G06T 2207/10061 (2013.01);
Abstract

A pattern matching apparatus includes a computer system configured to execute pattern matching processing between first pattern data based on design data and second pattern data representing a captured image of an electron microscope. The computer system acquires a first edge candidate group including one or more first edge candidates, acquires a selection-required number (the number of second edge candidates to be selected based on the second pattern data), acquires a second edge candidate group including the second edge candidates of the selection-required number, acquires an association evaluation value for each of different association combinations between the first edge candidate group and the second edge candidate group, selects one of the combinations based on the association evaluation value, and calculates a matching shift amount based on the selected combination.


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