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For the Inventor, By the Inventor

Yokohama, Japan

Wataru Nagatomo

This inventor holds 25 USPTO granted patents and 5 published patent applications, primarily in Pattern Matching Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Hitachi, Ltd.. Active years: 2005-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wataru Nagatomo. Retrieved from https://idiyas.com/inventor/wataru-nagatomo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25 

% Patents Active = 84.0

Average Co-Inventor Count = 3.5

ph-index = 8

Forward Citations = 147(Granted Patents)


Location History:

  • Yokohama, JP (2005 - 2014)
  • Mito, JP (2015)
  • Hitachinaka, JP (2014 - 2020)
  • Tokyo, JP (2017 - 2023)

Company Filing History:

goldMedal20 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal4 out of 1,386 
 
Hitachi High-Tech Corporation
 patents
bronzeMedal1 out of 42,731 
 
Hitachi, Ltd.
 patents

Years Active: 2005-2026

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Areas of Expertise:
Pattern Matching
Semiconductor Monitoring
Imaging Techniques
Scanning Electron Microscope
Template Matching
Cross-Sectional Shape
Measurement Systems
Calibration Methods
Inspection Apparatus
Pattern Dimensions
Imaging Recipe
25 patents (USPTO):Explore Patents
1. 12765325 - Processor system, semiconductor inspection system, and program (2026-10-13),
2. 12579778 - Pattern matching device, pattern measuring system, pattern matching program (2026-03-17),
3. 12412275 - Pattern matching device, pattern measurement system, and non-transitory computer-readable medium (2025-09-09),
4. 11669953 - Pattern matching device and computer program for pattern matching (2023-06-06),
5. 10535129 - Pattern matching apparatus and computer program (2020-01-14),
6. 10255519 - Inspection apparatus and method using pattern matching (2019-04-09),
7. 9619727 - Matching process device, matching process method, and inspection device employing same (2017-04-11),
8. 8971627 - Template matching processing device and template matching processing program (2015-03-03),
9. 8885950 - Pattern matching method and pattern matching apparatus (2014-11-11),
10. 8881067 - Method and apparatus for monitoring cross-sectional shape of a pattern formed on a semiconductor device (2014-11-04),
11. RE45224 - Method and apparatus for creating imaging recipe (2014-10-27),
12. RE45204 - Method and apparatus for creating imaging recipe (2014-10-20),
13. 8853630 - Scanning electron microscope and a method for imaging a specimen using the same (2014-10-07),
14. 8642957 - Scanning electron microscope and a method for imaging a specimen using the same (2014-02-04),
15. 8356260 - Method and apparatus for monitoring cross-sectional shape of a pattern formed on a semiconductor device (2013-01-15),

Title: Inventor Wataru Nagatomo - Revolutionizing Technology in Yokohama

Introduction: Wataru Nagatomo is a visionary inventor based in Yokohama, Japan, known for his groundbreaking contributions to the field of technology.

Latest Patents: Wataru Nagatomo holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Nagatomo has worked with leading tech companies in Japan, spearheading projects that have pushed the boundaries of what is possible in the realm of technology.

Collaborations: Throughout his career, Wataru Nagatomo has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Wataru Nagatomo's relentless pursuit of innovation and his passion for creating technology that improves lives make him a true pioneer in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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