The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Oct. 06, 2010
Applicants:

Wataru Nagatomo, Hitachinaka, JP;

Yuichi Abe, Mito, JP;

Mitsuji Ikeda, Hitachinaka, JP;

Inventors:

Wataru Nagatomo, Hitachinaka, JP;

Yuichi Abe, Mito, JP;

Mitsuji Ikeda, Hitachinaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6203 (2013.01); G06T 2207/10061 (2013.01); G06T 7/0044 (2013.01); G06K 9/6857 (2013.01); G06T 2207/30148 (2013.01); G06K 9/6253 (2013.01); G06T 2207/20016 (2013.01); H01J 2237/226 (2013.01); H01J 2237/221 (2013.01); G06K 9/6255 (2013.01);
Abstract

Provided is a template matching method and a template matching apparatus, where the degree of matching between a template and the actual image upon template matching is maintained at a high level, without depending on a partial appearance of a lower layer. Proposed as one embodiment, is a method and an apparatus for template matching, where either an area is set in which comparison of the template and the image is not conducted, or a second area is set inside the template where comparison different from comparison conducted in a first comparison area is to be conducted, and the template matching is conducted on the basis either of comparison excluding the non-comparison area, or of comparison using the first and second areas.


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