Kyoto, Japan

Yoshiro Nakata


Average Co-Inventor Count = 2.8

ph-index = 13

Forward Citations = 334(Granted Patents)


Location History:

  • Ikoma, JP (1991 - 1995)
  • Nara, JP (1998 - 1999)
  • Soraku-gun, JP (2004)
  • Kyoto, JP (1997 - 2009)

Company Filing History:


Years Active: 1991-2009

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23 patents (USPTO):Explore Patents

Title: Yoshiro Nakata: Innovator in Semiconductor Technology

Introduction

Yoshiro Nakata, an accomplished inventor based in Kyoto, Japan, has made significant contributions to the field of semiconductor technology. He holds an impressive portfolio of 23 patents, reflecting his innovative spirit and dedication to advancing electronic testing methods.

Latest Patents

Among his latest innovations, Nakata developed an "Inspection Apparatus and Method for Semiconductor IC." This invention utilizes a relay system to supply high voltage to a power-supply line, allowing for the sequential powering of PTC elements. This method effectively trips PTC elements connected to DC-defective semiconductor ICs in advance, thus enhancing the reliability of burn-in processes during testing. Another notable patent is for a "Semiconductor Integrated Circuit Testing System and Method." This system includes a wafer tray and interconnect substrate designed to test the electrical characteristics of multiple semiconductor integrated circuit devices simultaneously. A sealed space created between the tray and substrate ensures accurate results while an elastic sheet and specially designed probe terminals further enhance the functionality of the testing system.

Career Highlights

Nakata’s career spans noteworthy tenures at Matsushita Electric Industrial Co., Ltd. and Matsushita Electrical Industrial Co., Ltd., where he honed his skills and contributed to groundbreaking technologies. His expertise in semiconductor testing methodologies has established him as a leader in the field.

Collaborations

Throughout his career, Nakata has had the privilege of working alongside esteemed colleagues such as Shinichi Oki and Susumu Matsumoto. These collaborations have fostered a culture of innovation and have led to the development of several critical technologies in semiconductor testing.

Conclusion

Yoshiro Nakata's innovative patents and his work with industry leaders have significantly advanced semiconductor technology. His contributions continue to shape the future of integrated circuit testing and enhance the reliability of electronic devices. With a commitment to innovation, Nakata remains a pivotal figure in the development of advanced semiconductor solutions.

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