Hitachinaka, Japan

Yoshimasa Fukushima


Average Co-Inventor Count = 4.3

ph-index = 4

Forward Citations = 405(Granted Patents)


Location History:

  • Hikari, JP (1986 - 1989)
  • Hitachinaka, JP (2001 - 2014)
  • Tokyo, JP (2018)

Company Filing History:


Years Active: 1986-2018

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11 patents (USPTO):

Title: Innovations of Yoshimasa Fukushima

Introduction

Yoshimasa Fukushima is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 11 patents. His work has been instrumental in advancing the capabilities of various devices used in semiconductor inspection and evaluation.

Latest Patents

Fukushima's latest patents include a charged particle beam apparatus and a vibration damper for charged particle beam apparatus. The charged particle beam apparatus features a column supporting structure that incorporates a viscoelastic sheet, a supporting plate, and a fixation portion connecting the supporting plate to each lens barrel. This innovative design allows the viscoelastic sheet to extend in a plane perpendicular to the lens barrels, enhancing stability and performance. Additionally, his stage device is designed to be smaller and lighter, making it suitable for devices such as length measurement scanning electron microscopes (SEM). This device effectively reduces the impact of magnetic fields on electron beams, ensuring accurate measurements.

Career Highlights

Throughout his career, Yoshimasa Fukushima has worked with prominent companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience in these organizations has allowed him to develop and refine his inventions, contributing to the advancement of technology in his field.

Collaborations

Fukushima has collaborated with notable colleagues, including Masaki Mizuochi and Yutaka Kakehi. These partnerships have fostered innovation and have played a crucial role in the development of his patented technologies.

Conclusion

Yoshimasa Fukushima's contributions to the field of charged particle beam technology are significant and impactful. His innovative patents and collaborations highlight his dedication to advancing technology in semiconductor inspection and evaluation.

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