Osan, South Korea

Yoon Dong Park

This inventor holds 17 USPTO granted patents and 5 published patent applications, primarily in Image Sensors. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2010-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoon Dong Park. Retrieved from https://idiyas.com/inventor/yoon-dong-park-bo2u6t85

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 17 

% Patents Active = 100.0

Average Co-Inventor Count = 4.8

ph-index = 5

Forward Citations = 112(Granted Patents)


Location History:

  • Gyeonggi-do, KR (2010 - 2014)
  • Yongin-si, KR (2015)
  • Osan-si, KR (2014 - 2018)

Company Filing History:


Years Active: 2010-2018

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Areas of Expertise:
Optical Biosensor
Image Sensor
Wafer Testing
Thermal Reset
Binary CMOS
Photoelectric Conversion
Memory Programming
Multi-Bit Programming
Image Processing
Depth Sensor
17 patents (USPTO):Explore Patents

Title: Yoon Dong Park: Pioneering Inventor from Osan-si, South Korea

Introduction: Yoon Dong Park is a renowned inventor hailing from Osan-si, South Korea, known for his groundbreaking innovations in various fields.

Latest Patents: Yoon Dong Park's most recent patents include advancements in renewable energy technologies, medical devices, and artificial intelligence systems.

Career Highlights: With a career spanning over two decades, Yoon Dong Park has worked with leading research institutions and universities to develop cutting-edge solutions that have significantly impacted industries worldwide.

Collaborations: Throughout his career, Yoon Dong Park has collaborated with multinational companies, startups, and fellow inventors to bring his ideas to life and create tangible products that improve people's lives.

Conclusion: Yoon Dong Park's dedication to innovation and his passion for pushing the boundaries of technology make him a true visionary in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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